1900-S VAM-10B I4-R6 WR061819. Near Date, High S, Die Breaks Obverse.
Characteristics are described with a degree of granularity intended for die identification more so than for die classification.
A characteristic may not span the entire die progression.
Obverse: III2 2
Late die state shows numerous die cracks with displaced field and design breaks at several areas including rim-to-rim die crack at P in PLURIBUS with displaced field
retained cud die, crack at top of Phrygian cap with displaced design break at cap fold, crack on upper Liberty head neck up to jaw with displaced design break at jaw-neck junction and
crack on jaw up thru nose front into field with breaks at nose tip and displaced design break on chin.
Two large raised dots inside ear. Several fine long die scratches at IBU.
Three short diagonal die scratches at eagle's left wing and leg junction. Some slightly doubled leaves in left and right wreaths.
Obv certainly has a lot of die cracks with quite a few having displaced field and design breaks. Yes, must be terminal die state -- don't know why SF Mint used die in this
damaged condition. A nice find.
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- 11 Jun 2019